Bootstrap decoding of low-density parity-check codesNOUH, Ahmed; BANIHASHEMI, Amir H.IEEE communications letters. 2002, Vol 6, Num 9, pp 391-393, issn 1089-7798Article

Reliability-based schedule for bit-flipping decoding of low-density parity-check codesNOUH, Ahmed; BANIHASHEMI, Amir H.IEEE transactions on communications. 2004, Vol 52, Num 12, pp 2038-2040, issn 0090-6778, 3 p.Article

Reliability-based schedule for decoding low-density parity-check codesNOUH, Ahmed; BANIHASHEMI, Amir H.IEEE International Conference on Communications. 2004, isbn 0-7803-8533-0, vol1, 444-447Conference Paper

Compute Resource Management and TAT Control in Mask Data PrepNOUH, Ahmed; JANTZEN, Kenneth; PARK, Minyoung et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7272, issn 0277-786X, isbn 978-0-8194-7525-1 0-8194-7525-4, 727216.1-727216.8, 2Conference Paper

Compute resource management and turn around time control in mask data prepLEWIS, Travis; GOAD, Scott; JANTZEN, Kenneth et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7122, issn 0277-786X, isbn 978-0-8194-7355-4 0-8194-7355-3, 71222O.1-71222O.8, 2Conference Paper

Accelerating physical verification-using STPRL : a novel language for test pattern generationNOUH, Ahmed.Proceedings of SPIE, the International Society for Optical Engineering. 2007, pp 65331I.1-65331I.6, issn 0277-786X, isbn 978-0-8194-6655-6Conference Paper

More on accelerating physical verification using STPRL : a novel language for test pattern generationNOUH, Ahmed.Proceedings of SPIE, the International Society for Optical Engineering. 2007, pp 65211T.1-65211T.8, issn 0277-786X, isbn 978-0-8194-6640-2Conference Paper